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  • Tessent TestKompress Users Manual
    Tessent TestKompress creates and embeds compression logic (EDT logic) and generates compressed test patterns as follows: • Test patterns — Tessent TestKompress generates compressed test patterns and loads them onto the Automatic Test Equipment (ATE)
  • ATPG Chian Test Mismatch in serial and parallel patterns
    I have generated a chain test for serial and parallel patterns The test passes in serial mode but fails in parallel mode In the parallel mode, the test fails with chain mismatches of X (simulated value) vs 0 1 (expected) What can be the resons for such failures? How to debug such fails? What does it mean parallel patter?
  • Tessent TestKompress User Manual - Software Version 2014. 2
    User manual for Tessent TestKompress software version 2014 2, covering EDT technology and compressed pattern flows Learn scan chain synthesis
  • Tessent TestKompress | Siemens Software
    Tessent TestKompress, an industry-leading scan test tool, uses Embedded Deterministic Test technology to achieve the highest level of test quality while compressing scan patterns often 100X or more
  • A flexible flow for inserting embedded compression logic in RTL
    I’ll give some tips on how to avoid a couple of the common problems designers face when inserting compression logic during RTL design This new, more flexible, skeleton flow can significantly improve your RTL test insertion experience
  • Tessent TestKompress - Amazon Web Services, Inc.
    This document is for information and instruction purposes SISW reserves the right to make changes in specifications and other information contained in this publication without prior notice, and the reader should, in all cases, consult SISW to determine whether any changes have been made SISW disclaims all warranties with respect to this document including, without limitation, the implied warranties of merchantability, fitness for a particular purpose, and non-infringement of intellectual
  • Compressed test pattern generation with TestKompress
    Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage TestKompress offers comprehensive automation, TCL-based scripting, and introspection capabilities
  • Tessent TestKompress User Guide - studylib. net
    You cannot generate test patterns during EDT logic creation to determine the test coverage analyze_compression does not support dual compression configurations


















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